Browsing School of Science and Computing (JA) by Author "Xuliang, Zhang"

Browsing School of Science and Computing (JA) by Author "Xuliang, Zhang"

Sort by: Order: Results:

  • Assessing central cracks and interconnect reliability in flipchips 
    Juma, Mary A.; Xuliang, Zhang (2014-04)
    one of the most common forms of failures observed in brittle thin films subjected to stress is cracking. The crack growth rate depends on intrinsic film properties, stress and some environmental factors. we investigate ...
  • Assessing cracks and interconnect reliability in flipchips 
    Juma, Mary A.; Xuliang, Zhang (2014)
    One of the most common forms of failures observed in flipchips brittle thin films subjected to stress is cracking. The crack growth rate depends on intrinsic film properties, stress and some environmental factors. In part ...

Search Dspace


Browse

My Account