Browsing by Author "McCleland, J. L. C."

Now showing items 1-3 of 3

A case study on monitoring Potential Induced Degradation (PID) recovery in multi-crystalline modules

Kwembur, Isaac M.; McCleland, J. L. C.; Vorster, F. J.; van Dyk, E. E. (2020)

Potential Induced Degradation (PID) causes significant module degradation leading to decreased power output in photovoltaic (PV) power plants. Many PV power plants are constructed using transformerless inverters and may ...
Comparative study of Potential Induced Degradation approaches in multicrystalline Si PV modules

Kwembur, Isaac M.; McCleland, J. L. C.; van Dyk, E. E.; Vorster, F. J. (2019-11)

Potential Induced Degradation (PID) causes major reliability issues, since it results in significant performance degradation and negatively affects the durability of cells, modules and PV systems. In this work three ...
Detection of potential induced degradation in mono and multi-crystalline silicon photovoltaic modules

Kwembur, Isaac M.; McCleland, J. L. C.; van Dyk, E. E.; Vorster, F. J. (Elsevier, 2020-03)

Potential induced degradation (PID) is a performance limiting defect that profoundly impacts the power output of Photovoltaic (PV) modules. PID occurs because of leakage current between the solar cells and the aluminium ...

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