Please use this identifier to cite or link to this item: https://repository.seku.ac.ke/handle/123456789/2617
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dc.contributor.authorMunguti, Lawrence K.-
dc.contributor.authorNjoroge, W. K.-
dc.contributor.authorMusembi, R. J.-
dc.date.accessioned2016-07-15T09:14:28Z-
dc.date.available2016-07-15T09:14:28Z-
dc.date.issued2014-08-
dc.identifier.urihttp://etd-library.ku.ac.ke/handle/123456789/11040-
dc.identifier.urihttp://repository.seku.ac.ke/handle/123456789/2617-
dc.description.abstractTin doped zinc oxide thin films were deposited by reactive evaporation under various tin doping levels ranging from 1% to 8%. The deposition was done using Edwards Auto 306 coating unit at room temperature (25°C) and 5.0 x 10-5 mbar of chamber pressure. The optical transmittance spectra was obtained using UV-Vis-NIR spectrophotometer 3700 DUV in the visible wavelength 380-750nm. The doped films showed high transmittance >75% although slightly lower than that of undoped films. The band gap ranged from 2.95-3.95eV with the lowest value been attained at 4% tin doping. For the electrical characterization, sheet resistivity was carried using the four point probe at room temperature (25°C). The sheet resistivity ranged from 24.3-26.7Ωcm although it decreased with increase in doping concentration.en_US
dc.language.isoenen_US
dc.subjectZinc oxideen_US
dc.subjectDoping effectsen_US
dc.subjectOptical propertiesen_US
dc.subjectBand gapen_US
dc.titleZnO:Sn deposition by reactive evaporation: Effects of Sn doping on the electrical and optical propertiesen_US
dc.typeOtheren_US
Appears in Collections:School of Science and Computing (RP)

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